ASPECT
Filed: March 30, 2020
Electronic instruments for use in inspection and measurement of industrial components, namely, an automated substrate metrology…
Owned by: Onto Innovation Inc.
Serial Number: 88852248
ELEMENT
Filed: June 16, 2020
Fourier transform infrared system for determining the composition and quality of semiconductor substrates, namely, semiconductor…
Owned by: Onto Innovation Inc.
Serial Number: 90004454
AI DIFFRACT
Filed: August 10, 2020
Non-downloadable modeling, visualization and analysis software for use in analyzing physical structures on semiconductor…
Owned by: Onto Innovation Inc.
Serial Number: 90103469
REFLEX
Filed: December 8, 2020
Recorded computer software for use in the operation, control and calibration of metrology inspection equipment used in the…
Owned by: Onto Innovation Inc.
Serial Number: 90367243
ECHO
Filed: January 6, 2021
Picosecond optoacoustic system comprised of machines, components and operating software for characterizing thickness and…
Owned by: Onto Innovation Inc.
Serial Number: 90450352
IRIS
Filed: January 21, 2021
Automated system comprising a broad band spectroscopic ellipsometer and reflectometer for use in measuring thin film thickness…
Owned by: Onto Innovation Inc.
Serial Number: 90479624
ONTO
Filed: March 2, 2021
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors…
Owned by: Onto Innovation Inc.
Serial Number: 90555023
ONTO INNOVATION
Filed: July 8, 2021
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors…
Owned by: Onto Innovation Inc.
Serial Number: 90817217
IVISION
Filed: August 3, 2021
Image based measuring system for measuring overlay as well as critical dimensions of features in the production of semiconductors…
Owned by: Onto Innovation Inc.
Serial Number: 90863066
SURFSPEC
Filed: January 4, 2022
Profilometer, namely, a measuring instrument used to measure a surface profile and surface roughness
Owned by: Onto Innovation Inc.
Serial Number: 97201525
RUDOLPH
Filed: March 11, 2022
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors…
Owned by: Onto Innovation Inc.
Serial Number: 97308042
NANOMETRICS
Filed: March 11, 2022
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors…
Owned by: Onto Innovation Inc.
Serial Number: 97308047
ONTO
Filed: March 11, 2022
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer…
Owned by: Onto Innovation Inc.
Serial Number: 97308052
ONTO INNOVATION
Filed: March 11, 2022
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer…
Owned by: Onto Innovation Inc.
Serial Number: 97308055
ONTO INNOVATION
Filed: March 11, 2022
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer…
Owned by: Onto Innovation Inc.
Serial Number: 97308063
NSX
Filed: March 15, 2022
Inspection and metrology equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor…
Owned by: Onto Innovation Inc.
Serial Number: 97313388
ATLAS
Filed: March 17, 2022
Metrology equipment that employs spectroscopic ellipsometry and polarized reflectometry for measuring critical dimensions…
Owned by: Onto Innovation Inc.
Serial Number: 97316638
METAPULSE
Filed: March 17, 2022
Instruments for the measurement of thicknesses and mechanical properties of metal and opaque films
Owned by: Onto Innovation Inc.
Serial Number: 97316640
DISCOVER
Filed: March 18, 2022
downloadable software for use in analyzing manufacturing data, making predictions based on manufacturing data, analyzing…
Owned by: Onto Innovation Inc.
Serial Number: 97318714
