TI
Filed: February 21, 1978
INSTRUMENTS FOR CHARACTERIZING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTOR WAFERS, THIN FILMS, AND THE LIKE
Owned by: TENCOR INSTRUMENTS
Serial Number: 73159311
SONOGAGE RT2
Filed: January 11, 1979
Electronic Instrument for Measuring Physical and Electrical Properties of Semiconductor Wafers, Thin Films and the Like
Owned by: TENCOR INSTRUMENTS
Serial Number: 73199618
SPECTRAMAP
Filed: February 13, 1987
APPARATUS FOR TESTING THE QUALITY OF SEMICONDUCTOR WAFERS
Owned by: TENCOR INSTRUMENTS
Serial Number: 73644509
TENCOR
Filed: October 17, 1988
INSTRUMENTS FOR CHARACTERIZING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTOR WAFERS AND THIN [ WATER ] WAFERS
Owned by: TENCOR INSTRUMENTS
Serial Number: 73757817
SWIFTACCESS
Filed: June 26, 1995
computer programs comprising a system for management of yield in semiconductor manufacturing operations
Owned by: TENCOR INSTRUMENTS
Serial Number: 74693396
DBS
Filed: March 18, 1996
optically-based instrument and software for measuring the thickness of thin films on semiconductor wafers by means of reflectance…
Owned by: TENCOR INSTRUMENTS
Serial Number: 75074075
