SOLURIS INC. Trademarks
YOSEMITE
Metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication…
Owned by: SOLURIS INC.
Serial Number: 76379334
ULTRA LOW VOLTAGE
Metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication…
Owned by: SOLURIS INC.
Serial Number: 76379336
CRITICAL SHAPE METROLOGY
Computer software for metrology systems using a scanning electron microscope to measure features of semiconductor devices…
Owned by: SOLURIS INC.
Serial Number: 78320394
