SCAN & STEP
Filed: June 19, 1992
optical inspection apparatus for inspecting wafers, semi-conductors, reticles, and flat panel displays
Owned by: Orbot Instruments Ltd.
Serial Number: 74286290
PDI
Filed: February 28, 1995
optical inspection apparatus for inspecting wafers, semi-conductors, reticles and flat panel displays
Owned by: Orbot Instruments Ltd.
Serial Number: 74639373
PYE
Filed: March 16, 1998
Software for the operation of optical and charged particle diagnostic equipment for the inspection, review and measurement…
Owned by: Orbot Instruments Ltd.
Serial Number: 75450994
SEMVISION
Filed: April 22, 1998
Optical and charged particle diagnostic equipment, namely, scanning electron microscopes, for the inspection, review and…
Owned by: Orbot Instruments Ltd.
Serial Number: 75475458
DECIPHER
Filed: May 14, 1998
Optical and charged particle diagnostic equipment, namely, scanning electron microscopes, for the inspection, review and…
Owned by: Orbot Instruments Ltd.
Serial Number: 75498290
