HYPERNEX
Filed: December 5, 1997
X-ray and electronic apparatus for the non-destructive evaluation of solid materials
Owned by: NOVA MEASURING INSTRUMENTS, LTD.
Serial Number: 75400762
NOVA
Optical test equipment and measuring instruments, and computer operating systems thereof, computer software and hardware…
Owned by: NOVA MEASURING INSTRUMENTS, LTD.
Serial Number: 75722227
CU-TEX
semiconductor metrology instrument for measuring crystallographic texture of copper on wafers
Owned by: NOVA MEASURING INSTRUMENTS, LTD.
Serial Number: 75887574
HYPER-TEX
software for analysis of crystallographic texture measured by x-ray diffraction,
Owned by: NOVA MEASURING INSTRUMENTS, LTD.
Serial Number: 75887575
NOVATRACK
Optical test equipment, namely, monitoring, measuring and inspection instruments and computer operating systems thereof,…
Owned by: NOVA MEASURING INSTRUMENTS, LTD.
Serial Number: 76153398
