KABUSHIKI KAISHA NIHON MICRONICS Trademarks
MJC QDCCSS QUALITY + DELIVERY + COST + COMPLIANCE + SERVICE + SAFETY +
Filed: September 2, 2014
Probe cards for use in inspection of semiconductors; semiconductor inspection and testing equipment, namely, probe cards…
Owned by: KABUSHIKI KAISHA NIHON MICRONICS
Serial Number: 79158492
MICRONICS JAPAN
Filed: January 21, 2020
probe cards in the nature of semiconductor testing apparatus; apparatus for testing the electrical properties of semiconductors…
Owned by: KABUSHIKI KAISHA NIHON MICRONICS
Serial Number: 88767105
