J.A. WOOLLAM CO. INC. Trademarks

J.A. WOOLLAM CO. INC. Trademarks

H-VASE

Filed: July 24, 1998
ELLIPSOMETER, POLARIMETER, AND REFLECTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLE SYSTEMS
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 75525368

V-VASE

Filed: July 24, 1998
ELLIPSOMETERS, POLARIMETERS, AND REFLECTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLE SYSTEMS
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 75525369

M-44

M-88

G-VASE

Filed: April 19, 1999
INVESTIGATING SAMPLES OF SUBSTRATES WITH AND WITHOUT SURFACE LAYERS BY USING ELLIPSOMETERS, POLARIMETERS AND REFLECTOMETERS…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 75686688

E

Filed: January 6, 2000
ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLES
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 75889200

VASE

WVASE32

Filed: February 5, 2000
computer software used for acquisition and analysis of data for use with ellipsometers, polarimeters and spectrophotometers…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 75910900

JAWCO

Filed: March 24, 2000
Business consulting services for others in the field of ellipsometers, polarimeters and spectrophotometers which utilize…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76009111

VUV-VASE

Filed: August 11, 2000
ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLES IN VACUUM…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76107360

ALPHA-SE

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76577960

GENOSC

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76619235

GLOBAL FIT

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76619236

TEMPRAMP

IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR,…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637187

HEATCELL

IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR,…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76637188

VASEMANAGER

IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR,…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637190

TEMPRAMP-VASE

Equipment, namely ellipsometer based apparatus for measuring thickness and optical properties of semiconductor, disk drive…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637191

GENOSC-PREFIT

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637218

GENOSC-PG

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637219

GENOSC-GLOBAL FIT

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637220

GENOSC-

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76637221

MASE

EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76642718

ISE

IDENTIFY EQUIPMENT, namely, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR…
Owned by: J.A. WOOLLAM CO. INC.
Serial Number: 76720070