HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK Trademarks Page 1

HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK Trademarks

ISOSCOPE

Filed: May 19, 1972
MEASURING INSTRUMENTS FOR MEASURING ISOLATING LAYERS ON ELECTRICALLY CONDUCTING, NON-FERROUS METALS AND ON MAGNETIC CARRIER…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 72358558

ANOTEST

Filed: February 23, 1978
INSTRUMENTS FOR MEASURING BY PHASE ANGLE AND MAGNITUDE THE HOT WATER SEALING QUALITY OF ANODIZED ALUMINUM
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73159698

COULOSCOPE

Filed: July 30, 1979
ELECTRONIC MEASURING INSTRUMENTS-NAMELY, THICKNESS MEASURING INSTRUMENTS FOR MEASURING THE THICKNESS OF METALLIC FILMS AND…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73225239

FISCHER

Filed: January 18, 1980
Scientific Measuring Instruments Used Primarily in Laboratory and Industrial Applications-Namely, Meters for Measuring the…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73228574

DUALSCOPE

Filed: January 30, 1980
Electronic Measuring Instruments for Measuring the Thickness of Layers in the Range of 1 Micron to 1000 Microns
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73248203

DELTA-SCOPE

Filed: January 30, 1980
Electronic Measuring Instruments for Measuring the Thickness of Layers in the Range of 1 Micron to 1,000 Microns
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73248204

SIGMASCOPE

Filed: January 30, 1980
Measuring the Conductivity of Nonmagnetic Layers or Metals in the Range of 10 to 2000 Micrometers
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73248206

NICKELSCOPE

FISCHERSCOPE

Filed: February 20, 1980
Electrolyte for Coulometric Measuring Instruments
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73250830

STANOSCOPE

Filed: August 5, 1980
Coulometric Thickness Meters for Electroplated and Electroless Plated Metalic Deposits and Coatings
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73273005

POROSCOPE

Filed: October 24, 1980
Electronic Measuring Instruments-Namely, DC Porosity Holiday Testers for Measuring the Properties of Layers Having a Thickness…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73283167

FI

Filed: December 8, 1980
Electrolyte Solutions for Coulometric Measuring of Coating Thickness
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73289027

PERMASCOPE

Filed: April 5, 1982
Instruments for Measuring the Thickness of Non-Conductive and Non-Magnetic Metal Coatings on Substrates
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73358133

FERITSCOPE

Filed: February 17, 1983
Electronic Meters for Measuring the Ferrite Content of Austenitic Steel
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 73413847

MMS

Filed: September 25, 1995
variable electronic test assemblies with data handling, and sensors and measuring instruments that can be connected to them…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 74734254

XDVM

Filed: September 25, 1998
Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, […
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 75558644

XDL

XUVM

Filed: September 25, 1998
Scientific, electrical, optical monitoring and measuring instruments namely, coating thickness measurement instruments,[…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 75559728

XDLM

XDV

XUV

Filed: September 25, 1998
Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments,…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 75559898

FTM

PDM

Filed: December 28, 1998
software for use with instruments that use X-rays for measuring layer thicknesses
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 75612594

XAN

Filed: June 22, 2000
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 76075903

XUL

Filed: September 29, 2000
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thickness of coatings…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 76138031

XULM

Filed: September 29, 2000
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thinkness of coatings…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 76138032

JEWELRING

Filed: April 30, 2002
Platens for Beta-Backscatter Radiation Measuring Instruments, Used in Measuring Thin Films
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 76402726

XDAL

Scientific, electrical, optical, monitoring and measuring instruments, namely instruments for measuring the thickness of…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 76475748

PHASCOPE

Filed: January 17, 2003
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 78204768

PICODENTOR

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the physical properties…
Owned by: HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Serial Number: 78296949