MICROSORT
Filed: January 3, 1980
Non-Contact Apparatus for Electronically Sorting and Gauging the Thickness and Resistivity of Semi-Conductor Substrates
Owned by: ADE CORPORATION
Serial Number: 73245056
WAFERSCAN
Filed: February 29, 1980
Apparatus for Electronic Non-Contacting Flatness Gaging of Semiconductor Substrates
Owned by: ADE CORPORATION
Serial Number: 73251946
WAFERCHECK
Filed: February 16, 1982
Apparatus for Electronic Non-Contacting Gaging, Testing, and Sorting of Semiconductor Substrates
Owned by: ADE CORPORATION
Serial Number: 73350409
TENSOR
Filed: November 21, 1994
signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer…
Owned by: ADE CORPORATION
Serial Number: 74600820
ADE TENSOR
Filed: December 15, 1994
signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer…
Owned by: ADE CORPORATION
Serial Number: 74611401
INFOHUB
Filed: September 26, 1995
hardware and software for coordinating semiconductor processing functions
Owned by: ADE CORPORATION
Serial Number: 74734398
WAFER REPORT CARD
Filed: September 26, 1995
computer hardware and software for analyzing semiconductor wafer characteristics and providing output data thereon
Owned by: ADE CORPORATION
Serial Number: 74734399
YIELD ENHANCEMENT SOLUTIONS
Filed: October 15, 1997
Software for semiconductor wafer test data analysis
Owned by: ADE CORPORATION
Serial Number: 75373442
GALAXY AWIS - 300
Filed: March 26, 1998
Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor…
Owned by: ADE CORPORATION
Serial Number: 75456776
STRESSTOOLS
Filed: March 26, 1998
Software for use in measuring and analyzing stress values for substrates, particularly semiconductor wafers
Owned by: ADE CORPORATION
Serial Number: 75456780
ASC2000
Filed: March 26, 1998
System comprising computer hardware and software for measuring substrate characteristics, namely, for measuring semiconductor…
Owned by: ADE CORPORATION
Serial Number: 75456781
METROTOOLS
Filed: March 26, 1998
Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind…
Owned by: ADE CORPORATION
Serial Number: 75456783
UNIMET
Filed: March 26, 1998
A system comprising transduction and interface hardware and computer software for metrology of wafer substrates, particularly…
Owned by: ADE CORPORATION
Serial Number: 75456784
GALAXY AFS-300
Filed: March 26, 1998
Substrate inspection system, comprising hardware and associated software for measurement of substrates, namely, semiconductor…
Owned by: ADE CORPORATION
Serial Number: 75456785
DCS-II
Filed: March 26, 1998
system comprising computer interface hardware and computer software for non-contact inspection and data analysis, particularly…
Owned by: ADE CORPORATION
Serial Number: 75456813
LITHOTOOLS
Filed: March 26, 1998
Software for use in measuring and analyzing flatness of substrates, particularly semiconductor wafers, and more particularly…
Owned by: ADE CORPORATION
Serial Number: 75456822
GALAXY
Filed: March 26, 1998
Inspection of substrates, particularly a system for inspection of semiconductor wafers, and more particularly for measurement…
Owned by: ADE CORPORATION
Serial Number: 75457453
OPENADC
Filed: March 26, 1998
System comprising computer hardware and software for use in the analysis of substrate data, particularly semiconductor wafer…
Owned by: ADE CORPORATION
Serial Number: 75457539
AUTOGAGER
robotic device for magnetic disk media sorting, particularly for the sorting of hard disk drive media for use in the computer…
Owned by: ADE CORPORATION
Serial Number: 75554565
NANOSORT
COMPUTER SOFTWARE, NAMELY COMPUTER SOFTWARE FOR ANALYZING SEMICONDUCTOR WAFERS FOR FLATNESS
Owned by: ADE CORPORATION
Serial Number: 75584667
SQM
computer software for use in measuring the nanotopology of a wafer surface area to determine surface quality
Owned by: ADE CORPORATION
Serial Number: 75654300
NANOSTRUCTURE
non contact gauge and associated software for dimensionally characterizing a substrate, particularly a semiconductor wafer…
Owned by: ADE CORPORATION
Serial Number: 75703372
ADE FACTORY
Instrument; namely, a fabrication and testing apparatus and systems, comprising, in devices for the fabrication of semiconductors…
Owned by: ADE CORPORATION
Serial Number: 75703507
NANOTOPOLOMETER
Device and software for the characterization of a substrate, particularly a device for the analysis of substrate data of…
Owned by: ADE CORPORATION
Serial Number: 75703508
NANOFLAT
NON-CONTACT SUBSTRATE SURFACE DIMENSION MEASUREMENT HARDWARE AND ASSOCIATED DATA ANALYSIS SOFTWARE FOR PROCESSING SUBSTRATE…
Owned by: ADE CORPORATION
Serial Number: 75703509
NANOMETROLOGY
NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMICONDUCTOR…
Owned by: ADE CORPORATION
Serial Number: 75703510
NANOMASTER
Calibration standards for use in calibrating measurement apparatus
Owned by: ADE CORPORATION
Serial Number: 75703511
NANOTOPOMETER
optical imaging hardware for providing measurement of substrates, particularly semiconductors wafer and software for data…
Owned by: ADE CORPORATION
Serial Number: 75703512
NANOTOPOLOGY
NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMI…
Owned by: ADE CORPORATION
Serial Number: 75703513
NANOFLATNESS
NON-CONTACT SUBSTRATE SURFACE GAUGE AND COMPUTER SOFTWARE OPERATIVE THEREWITH FOR SUBSTRATE SURFACE PROFILING IN THE SEMICONDUCTOR…
Owned by: ADE CORPORATION
Serial Number: 75703514
NANOSENSE
non-contact substrate surface dimension measurement hardware and associated data analysis software for processing substrate…
Owned by: ADE CORPORATION
Serial Number: 75703515
NANOSTANDARD
semiconductor wafer gauge structures having know dimensional properties to be used in place of semiconductor wafers for…
Owned by: ADE CORPORATION
Serial Number: 75703516
ADE FACTORY
INSTALLATION AND MAINTENANCE OF COMPUTER HARDWARE
Owned by: ADE CORPORATION
Serial Number: 75703802
NANOMORPHOLOGY
NON-CONTACT SUBSTRATE SURFACE DIMENSION MEASUREMENT HARDWARE AND ASSOCIATED DATA ANALYSIS SOFTWARE FOR PROCESSING SUBSTRATE…
Owned by: ADE CORPORATION
Serial Number: 75703803
WAFERANALYZER
SOFTWARE FOR USE IN THE DETECTION OF PROBLEMS IN THE SEMICONDUCTOR DEVICE PROCESS, BY SPEEDING THE DATA COLLECTION PROCESS…
Owned by: ADE CORPORATION
Serial Number: 75706166
FABTYE
Management information services, namely, gathering, analyzing and disseminating information obtained and used in semiconductor…
Owned by: ADE CORPORATION
Serial Number: 75749442
AWIS-300
Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor…
Owned by: ADE CORPORATION
Serial Number: 75807675
AFS-300
Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely…
Owned by: ADE CORPORATION
Serial Number: 75808283
WAFER REPORT CARD
Computer services, namely, analyzing for others, semiconductor wafer characteristics and providing out put data thereon
Owned by: ADE CORPORATION
Serial Number: 76116879
AUTOGAGER
computerized robotic apparatus for magnetic disk media sorting, particularly the sorting of hard disk drive media for use…
Owned by: ADE CORPORATION
Serial Number: 76180051
