WVASE
Filed: October 18, 1993
computer software for use in variable angle spectroscopic ellipsometers
Owned by: J. A. Woollam Co., Inc.
Serial Number: 74447708
G-VASE
Filed: April 10, 1997
ellipsometers, polarimeters and reflectometers which utilize electromagnetic radiation to investigate samples
Owned by: J. A. Woollam Co., Inc.
Serial Number: 75272441
DARCE
Filed: May 28, 1997
ellipsometer, polarimeter, reflectometer and the like systems which utilize polarized electromagnetic radiation to investigate…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 75299797
HS-190
Filed: July 14, 1997
monochrometers such as utilized in ellipsometer, polarimeter, reflectometer and the like systems which utilize electromagnetic…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 75323547
G-VASE
Filed: July 14, 1997
ellipsometer, polarimeter and reflectometer which utilize polarized electromagnetic radiation to investigate sample systems…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 75323548
AUTORETARDER
Filed: July 24, 1998
ELLIPSOMETERS, POLARIMETERS, AND REFLECTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLE SYSTEMS
Owned by: J. A. Woollam Co., Inc.
Serial Number: 75525372
J. A. WOOLLAM CO.
consulting services to others in the field of ellipsometers, polarimeters and spectrophotometers which utilize electromagnetic…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76009112
J. A. WOOLLAM CO.
Technical consulting services performed at the request of, and for the benefit of others, related to design, construction…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76297818
EASE
IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR,…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76637189
M-3000
EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76660924
MM-3000
EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76660925
THZ-SE
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76696428
THZ-VASE
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE…
Owned by: J. A. Woollam Co., Inc.
Serial Number: 76696429
