WYKO
Filed: May 28, 1985
LASER DIODE TESTER AND A MEASURING INSTRUMENT NAMELY, NON CONTACT PROFILER
Owned by: Bruker Nano, Inc.
Serial Number: 73539674
PEAK FORCE TAPPING
Filed: February 23, 2010
SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING…
Owned by: Bruker Nano, Inc.
Serial Number: 77942662
DIMENSION FASTSCAN
Filed: February 1, 2011
Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Software for operating probe-based…
Owned by: Bruker Nano, Inc.
Serial Number: 85231588
FASTSCAN
Filed: February 1, 2011
Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based…
Owned by: Bruker Nano, Inc.
Serial Number: 85231607
DEKTAKXT
Filed: May 20, 2011
Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor
Owned by: Bruker Nano, Inc.
Serial Number: 85326468
AUTOMET
Filed: October 14, 2011
Software for metrology tools, namely, analysis software for atomic force microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 85447873
NANOLENS
Filed: November 21, 2012
METROLOGY INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND STYLUS PROFILERS; SOFTWARE FOR OPERATING METROLOGY INSTRUMENTS…
Owned by: Bruker Nano, Inc.
Serial Number: 85785423
ACUITYXR
Filed: April 19, 2013
metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology tools
Owned by: Bruker Nano, Inc.
Serial Number: 85909485
LUMIMAP
Filed: June 14, 2013
metrology system comprising metrology tools for surface analysis and software for enhancing high performance of nanoscale…
Owned by: Bruker Nano, Inc.
Serial Number: 85960471
DIMENSION FASTSCAN BIO
Filed: August 13, 2013
probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating the aforementioned…
Owned by: Bruker Nano, Inc.
Serial Number: 86036171
INSPIRE
Atomic Force Microscopes and Scanning Probe Microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 86385476
BIOSCOPE RESOLVE
Filed: November 4, 2014
Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Owned by: Bruker Nano, Inc.
Serial Number: 86444543
RESOLVE
Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Owned by: Bruker Nano, Inc.
Serial Number: 86444566
FASTFORCE VOLUME
Filed: December 15, 2014
Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)
Owned by: Bruker Nano, Inc.
Serial Number: 86480816
MIROVIEW
Filed: December 15, 2014
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs…
Owned by: Bruker Nano, Inc.
Serial Number: 86480824
CONTOUR ELITE
Filed: March 27, 2015
Metrology devices, namely, surface profiling machines and optical microscopes for characterizing and measuring surface parameters…
Owned by: Bruker Nano, Inc.
Serial Number: 86579461
PEAKFORCE TAPPING
Filed: March 14, 2016
software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating…
Owned by: Bruker Nano, Inc.
Serial Number: 86939314
ULTIMA NEURALIGHT 3D
Microscopes, and accessories therefor, namely, a holographic image generation attachment
Owned by: Bruker Nano, Inc.
Serial Number: 87221625
NEURALIGHT 3D
Filed: October 31, 2016
Microscopes, and accessories therefor, namely, a holographic image generation attachment
Owned by: Bruker Nano, Inc.
Serial Number: 87221634
FASTSCAN
probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based…
Owned by: Bruker Nano, Inc.
Serial Number: 87222941
NANOSCOPE
Filed: October 2, 2018
scanning probe microscopes; software for operating scanning probe microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 88140113
TRUESENSE
Filed: December 20, 2018
Software employed to operate scanning probe microscopes, including atomic force microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 88237465
SUPERSENSE
Filed: December 20, 2018
Software employed to operate scanning probe microscopes, including atomic force microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 88237471
DTSENSE
Filed: December 20, 2018
Software employed to operate scanning probe microscopes, including atomic force microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 88237487
DIMENSION ICONIR
Filed: October 6, 2021
probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data…
Owned by: Bruker Nano, Inc.
Serial Number: 97062382
ICONIR
Filed: October 6, 2021
probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data…
Owned by: Bruker Nano, Inc.
Serial Number: 97062401
NEURALIGHT 3D ULTRA
Filed: January 17, 2022
microscopes, and accessories therefor, namely, a holographic image generation attachment
Owned by: Bruker Nano, Inc.
Serial Number: 97223319
TRIBOLAB
Filed: January 24, 2022
Tribology and micromechanical testing instruments, namely, tribometers and mechanical testers in the nature of macro-, micro…
Owned by: Bruker Nano, Inc.
Serial Number: 97235484
NANOIR
Filed: February 23, 2022
probe-based instruments, namely, atomic force microscopes and recorded operating software sold as a unit
Owned by: Bruker Nano, Inc.
Serial Number: 97280961
PEAKFORCE-QI
Filed: April 29, 2022
recorded and downloadable software for operating probe-based instruments in the fields of manufacturing and for use in scientific…
Owned by: Bruker Nano, Inc.
Serial Number: 97388284
HYPERMAP
Filed: August 31, 2022
Probe-based instruments, namely, atomic force microscopes, and recorded software for operating probe-based instruments
Owned by: Bruker Nano, Inc.
Serial Number: 97573343
NANOMET
Filed: May 5, 2023
Metrology instruments, namely, scanning probe microscopes
Owned by: Bruker Nano, Inc.
Serial Number: 97922649
DYNASYST
Filed: November 30, 2023
Software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating…
Owned by: Bruker Nano, Inc.
Serial Number: 98293163
TAPPING AFM-IR
Filed: April 24, 2024
Software and hardware for operating probe-based instruments, namely, scanning probe microscopes and atomic force microscopes…
Owned by: Bruker Nano, Inc.
Serial Number: 98516606
