NANOSRP
Filed: April 8, 1994
spreading resistance profilers
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 74515760
SSM
Filed: November 30, 1994
electrical characterization apparatus for use in measuring conductivity and resistivity of bulk and thin-film semiconductor…
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 74604529
NANOGAP
Filed: June 12, 1998
device for noncontact electrical measurement of the capacitance versus voltage response of silicon wafers
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 75501606
NANOCV
Device for electrical measurement of the capacitance versus voltage response of silicon wafers
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 76074798
FASTGATE
Electromechanical apparatus for measuring the electrical properties of semiconductor wafers
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 76091102
FASTGUARD
Electronic apparatus for measuring the electrical properties of semiconductor wafers
Owned by: SOLID STATE MEASUREMENTS, INC.
Serial Number: 76132779
