MICROSCAN
Filed: August 4, 1989
COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 73817101
Image Trademark
Filed: April 4, 1990
optical inspection measurement devices for use in the field of semiconductor manufacturing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 74045681
INFOTOOLS
Filed: March 26, 1998
Computer hardware and computer software for coordinating semiconductor processing functions
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75456782
CONSTELLATION
Filed: March 26, 1998
Automated inspection device comprising optical scanning hardware and software for the inspection and analysis of data, namely…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75456823
EPISCAN
Filed: March 26, 1998
measuring system comprising computer hardware and software for measuring film thickness, namely, EPI thickness, transition…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75457537
DEVICE TOOLBOX
Filed: March 26, 1998
Computer software used to provide central recipe storage and to create, edit, and save recipe files regarding semiconductor…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75457540
NANOPRO
Filed: July 24, 1998
INSTRUMENTS FOR TESTING AND INSPECTING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTORS; COMPUTER HARDWARE AND SOFTWARE…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75524701
NANOMAP
Filed: July 24, 1998
apparatus and software for inspecting semiconductors, semiconductor wafers, and related components
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75524786
NANOTOPOGRAPHY
Filed: August 10, 1998
apparatus and software for inspecting semiconductors, semiconductor wafers and parts therefor
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75533722
YIELDLABOR
consulting services in the field of manufacturing of semiconductors
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539355
BITPOWER
computer software for yield management in semiconductor manufacturing and testing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539739
WATERFALL SAMPLING
computer software for yield management in semiconductor manufacturing and testing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539740
YIELDONE
consulting services in the field of manufacturing of semiconductors
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539743
YIELDSUPPORT
consulting services in the field of manufacturing of semiconductors
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539745
YIELDLINK
computer software for yield management in semiconductor manufacturing and testing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539747
FLOORLINK
computer software for yield management in semiconductor manufacturing and testing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539827
YIELDASSIST
consulting services in the field of manufacturing of semiconductors
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75539828
µAE
OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75601342
MICROAE
OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75601345
ACE
instruments, namely, automated semiconductor wafer test equipment, for testing and inspecting physical and electrical properties…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75656604
ABSOLUTE ELLIPSOMETER
OPTICAL INSPECTION EQUIPMENT COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75673980
YIELDNET
computer software for yield management in semiconductor manufacturing
Owned by: KLA-TENCOR CORPORATION
Serial Number: 75854874
INTEGRA
RADIATION BASED INSPECTION EQUIPMENT, NAMELY, SPECTROMETERS, ELLIPSOMETERS, X-RAY REFLECTOMETERS AND THERMAL AND PLASMA…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76074286
INDABA
Computer hardware and software used to implement diagnostic capabilities in semiconductor manufacturing equipment via computer…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76124892
PRECICE
Computer hardware, software, and user manuals sold as a unit, all for inspecting and measuring semiconductor devices; and…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76250632
WBWS
OPTICAL SYSTEM FOR MEASURING THE CURVATURE OF A SEMICONDUCTOR WAFER, COMPOSED OF A LIGHT SOURCE AND A DETECTOR AND A PROCESSOR…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76272994
ARCHER 10
Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76284101
IRECIPE
Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76284120
ECORRELATE
computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315026
µLOOP
Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315078
EDRC
Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315079
EYIELD
Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315080
EY0
computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315195
MICROLOOP
Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315196
NANOLOOP
Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76315206
FIT
laser surface scanning system comprised of a laser, a computer and a rotating translating stage for inspection of non-patterned…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76327695
E-SQUARED
Apparatus for measurement of silicon wafer thickness, flatness and shape
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76327744
NANOXAM
evaluation machines and associated operating software for semiconductor-based products
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76664448
WAFERXAM
evaluation machines, namely, inspection and measurement machines for defect and particle detection for semiconductor-based…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 76664449
RPI
Computer hardware, software and user manuals sold as a unit, and equipment, namely, inspection, metrology and testing hardware…
Owned by: KLA-TENCOR CORPORATION
Serial Number: 77611414
