SENSORS; SENSORS FOR MEASURING INSTRUMENTS; SENSORY SOFTWARE; SENSORS, DETECTORS AND MONITORING INSTRUMENTS; SENSORS [MEASUREMENT APPARATUS], OTHER THAN FOR MED-ICAL USE; SENSOR CONTROLLERS; SENSORS FOR REAL TIME DATA INPUT APPARATUS; SENSORS FOR REAL TIME DATA OUTPUT APPARATUS; MATERIALS FOR QUANTUM DETECTION AND QUANTUM COMPUTING; MATERIALS FOR QUANTUM SENSING AND QUANTUM COMPUTING; MATERIALS FOR QUANTUM DETECTION AND COMPUTING; SEMICONDUCTORS; SEMICONDUCTOR ELEMENTS; SEMICONDUCTOR TESTING APPARATUS; INTEGRATED CIRCUITS; TESTING AND QUALITY CONTROL DEVICES; MAGNETIC SENSORS; MAGNETIC FLUX SENSORS; MAGNETIC DETECTORS; SCIENTIFIC APPARATUS AND INSTRUMENTS; DIAGNOSTIC APPARATUS, NOT FOR MEDICAL PURPOSES; TEST PROBE ASSEMBLIES FOR INTEGRATED CIRCUITS; TESTING APPARATUS AND INSTRUMENTS; TESTING APPARATUS FOR CHECKING ELECTRONIC DEVICES; TESTING APPARATUS FOR CHECKING OPTICAL DEVICES; TESTING APPARATUS FOR ELECTRONIC EQUIPMENT; TESTING APPARATUS FOR TESTING PRINTED CIRCUIT BOARDS; DETECTING APPARATUS AND INSTRUMENTS; DETECTION APPARATUS; MEASURING SENSORS; OPTICAL SENSORS; ELECTRIC SENSORS; ELECTRICAL SENSORS; ELECTRO-OPTICAL SENSORS; ELECTRIC CURRENT SENSORS; ELECTRICAL LEAK DETECTION HARDWARE WITH EMBEDDED OPERATING SYSTEM SOFTWARE; LASER DETECTORS; LASER MEASURING SYSTEMS; LASERS FOR MEASURING; LASERS FOR MEASURING PURPOSES; LASER SENSORS; MICROSCOPE; MICROSCOPE LENSES; MICROSCOPE OBJECTIVES; FLOURESCENCE MICROSCOPE; MICROSCOPE ILLUMINATING DEVICES; LENSES FOR MICROSCOPES; TURNTABLES [PARTS OF MICROSCOPES]; OPTICAL MICROSCOPES FOR BIOLOGICAL PURPOSES; OPTICAL MICROSCOPES FOR INDUSTRIAL PUR-POSES; OPTICAL MICROSCOPES FOR INDUSTRIAL USE; OPTICAL MICROSCOPES FOR MATERIALS TESTING; OPTICAL MICROSCOPES FOR SCIENTIFIC PURPOSES; OPTICAL MICROSCOPES FOR TESTING OF MATERIALS; NON-DESTRUCTIVE TESTING APPARATUS; REAL-TIME DATA PROCESSING APPA-RATUS; TEMPERATURE MONITORS FOR SCIENTIFIC USE; TEMPERATURE MONITORS FOR INDUSTRIAL USE; TEMPERATURE SENSING APPARATUS FOR SCIENTIFIC USE; TEMPERATURE SENSITIVE TEST-ING APPARATUS FOR INDUSTRIAL USE; TEMPERATURE SENSITIVE TESTING APPARATUS FOR SCIEN-TIFIC USE; THERMAL SENSORS [THERMOSTATS]; HEAT SENSING IDENTIFICATION INDICATORS

TECHNICAL CONSULTANCY IN RELATION TO THE PRODUCTION OF SEMICONDUCTORS; ADVISORY SERVICES RELATING TO SCIENTIFIC INSTRUMENTS; ADVISORY SERVICES RELATING TO TECHNOLOGI-CAL RESEARCH; ADVISORY SERVICES RELATING TO SCIENCE; ADVISORY SERVICES RELATING TO SCIENTIFIC RESEARCH; CALIBRATION OF INSTRUMENTS; CALIBRATION [MEASURING]; CALIBRATION SERVICES; CALIBRATION SERVICES RELATING TO ANALYTICAL APPARATUS; CALIBRATION SERVICES RELATING TO ELECTRONIC APPARATUS; COMPUTER AIDED INDUSTRIAL ANALYSIS SERVICES; CON-DUCTING INDUSTRIAL TESTS; CONSULTANCY IN THE FIELD OF SCIENTIFIC RESEARCH; CONSULTANCY IN THE FIELD OF INDUSTRIAL RESEARCH; CONSULTANCY IN THE FIELD OF TECHNOLOGICAL RESEARCH; CONSULTANCY SERVICES RELATING TO TECHNOLOGICAL RESEARCH; DESIGN AND DEVELOPMENT OF ENGINEERING PRODUCTS; DESIGN AND DEVELOPMENT OF INDUSTRIAL PRODUCTS; DEVELOP-MENT OF INDUSTRIAL PROCESSES; DEVELOPMENT OF NEW PRODUCTS; DEVELOPMENT OF NEW TECHNOLOGY FOR OTHERS; DEVELOPMENT OF TESTING METHODS; SCIENTIFIC RESEARCH IN THE FIELD OF QUANTUM TECHNOLOGY; RESEARCH IN THE FIELD OF QUANTUM PRECISION MEASURING; CONSULTANCY AND RESEARCH IN THE FIELD OF QUANTUM TECHNOLOGY; CONSULTANCY AND RE-SEARCH IN THE FIELD OF QUANTUM ENGINEERING; DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE RELATING TO QUANTUM TECHNOLOGY; DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE RELATING TO QUANTUM ENGINEERING; MAINTENANCE AND UPDATING OF SOFTWARE RELATING TO QUANTUM TECHNOLOGY; RESEARCH IN THE AREA OF SEMICONDUCTOR PROCESSING TECHNOLOGY; RESEARCH IN THE FIELD OF QUANTUM SIMULATION; SCIENTIFIC AND TECHNOLOGICAL SERVICES RELATING TO QUANTUM MATERIALS; SCIENTIFIC RE-SEARCH IN THE FIELD OF QUANTUM ENGINEERING; SCIENTIFIC AND TECHNOLOGICAL SERVICES RE-LATING TO QUANTUM RESEARCH; MAINTENANCE AND UPDATING OF SOFTWARE RELATING TO QUAN-TUM ENGINEERING; ENGINEERING WORK; EXPERT OPINION RELATING TO TECHNOLOGY; EXPERT ADVICE RELATING TO TECHNOLOGY; MACHINE CONDITION MONITORING; MEASUREMENT SER-VICES; SCIENCE AND TECHNOLOGY SERVICES; SCIENTIFIC SERVICES AND DESIGN RELATING THERETO; SCIENTIFIC SERVICES AND RESEARCH RELATING THERETO; SCIENTIFIC TECHNOLOGICAL SERVICES; SOFTWARE AS A SERVICE; SOFTWARE AS A SERVICE [SAAS] SERVICES; SERVICES FOR THE DEVELOPMENT OF METHODS OF TESTING; TECHNICAL DATA ANALYSIS; TECHNICAL DATA ANALYSIS SERVICES; QUALITY ASSESSMENT; QUALITY CHECKING; QUALITY TESTING; QUALITY CONTROL; QUALITY CONTROL CONSULTANCY; PRODUCT QUALITY CONTROL; QUALITY ASSURANCE SERVICES; QUALITY TESTING SERVICES; QUALITY CONTROL SERVICES; NON