Probes for testing semiconductors; in-circuit probes and functional test probes used in the quality inspection of electronic circuits; PCB probes for testing printed circuit boards; high frequency probes for use in taking in-circuit measurements of electrical capacity; high current probes for powered functional testing of connectors, wire harnesses, and modules; battery probes consisting of compact spring loaded electrical contacts used for fast and easy detachable connections; integrated circuit sockets used in devices that contain an integrated circuit as a placeholder for IC chips to allow safe removal and insertion of IC chips; switch probes in the nature of a spring contact probe and receptacle combination for use in verifying the correct location of a terminal in a connector and checking the retention force, for use in the cable harness testing industry; automotive testing equipment, namely, an automotive probe for use in diagnosing short circuits and bad earth connections in automotive electrical systems; integrated circuit cards, namely, smart cards; car navigation computers; smoke detectors and carbon monoxide detectors; tool measuring instrument; integrated circuit; integrated circuit blocks in the nature of modules; electrical wire and audio cables; electrical connectors; electrical plugs and electrical components in the nature of electric contactors; computer peripheral equipment; glass covered with an electrical conductor; electric control devices for testing PCBs or chip sets and automation