Downloadable computer software for remote monitoring and analysis for use in patterning, processing in the fields of micro and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software for monitoring, analysing, controlling and running physical world operations all in the fields of micro- and nanoscale science and technology; computer software for use in remote meter monitoring; measuring, detecting, monitoring and controlling devices; scanning electron microscopes; scanning probe microscopes; apparatus and instruments for scanning probe microscopy; metering software, recognition software, monitoring software, control software, the aforementioned goods for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: metrology; software, for use in the following fields: control of micro structuring and nano structuring systems; software, for use in the following fields: control of lithography systems; software, for use in the following fields: classification in the fields of micro- and nanoscale science and technology; software, for use in the following fields: detection of defects; software, for use in the following fields: process control in the fields of micro- and nanoscale science and technology; software, for use in the following fields: process monitoring in the fields of micro- and nanoscale science and technology; microscopy software; software, for use in relation to the following goods: scanning electron microscopes; software, for use in the following fields: surface structuring; software, for use in the following fields: surface analysis; software, for use in the following fields: material analyzes; automation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; simulation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: monte carlo simulations; simulation software, for use in the following fields: material analyzes; simulation software, for use in the following fields: surface analysis; simulation software, for use in the following fields: scanning electron microscopes; calibration software; measuring sensors; computer hardware for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection

Materials testing and analysing; calibration services relating to analytical apparatus; installation, maintenance, updating and upgrading of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; installation, maintenance and updating of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software as a service [SaaS] for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design, development and programming of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design and development of computer software for process control in the fields of micro- and nanoscale science and technology; software design for others for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; calibration of processes