Scientific, research, optical, measuring and testing instruments and systems; opto-electronical measuring instruments and systems, namely, probe cards for wafer probers and components thereof; optical sensing devices; sensor cards, sensing devices for testing of photonic integrated circuits and parts and components thereof; measuring stations for testing and examination of integrated circuits and semiconductor elements, namely probe cards for wafer level testing of photonic integrated circuits; sensor cards for use in connection with testing of integrated circuits and semiconductor devices; optical waveguide sensors or electronic components for use in wafer testing of circuits; positioning fixture for testing of integrated circuits and semiconductor devices; optical inspection apparatus for semiconductor elements and integrated circuits; testing, inspection and examination instruments for electrical and electro-optical reliability testing of integrated circuits and semiconductor elements; opto-electronical testing, measuring equipment for micro-opto-electrical-mechanical systems (MOEMS), micro-electro-mechanical systems (MEMS), wafer, optical and electronical elements and systems, electronic chips, computer-chip sets, electronic chip cards, chips with integrated circuits; photonic-integrated circuits (PICs); downloaded, recorded software for control of afore-mentioned instruments, apparatus and systems; downloaded, recorded computer programs for electronical, optical and opto-electronical instruments, apparatus and systems

Scientific and technological services, namely, testing of photonic integrated circuits and designing testing equipment therefore as well as research activities and designing services relating thereto; services of engineers; industrial research in the field of testing of photonic integrated circuits; design and planning of opto-electronical apparatus and instruments; design of optical and micro-optical elements and systems; development, programming and implementing software for electronical, optical and opto-electronical instruments, apparatus, measuring and testing systems