Scientific, photographic, optical, measuring, signaling and testing apparatus and instruments, namely, powder thickness gauge, profiling gauge, eddy current gauge, coating thickness gauge, stiffness gauge, conductivity gauge, electric conductivity gauge, tension gauge, tensionmeter, magnetic permeability gauge; apparatus for recording, transmission and reproduction of sounds or images; data processing apparatus; computers; computer software for use in database management, use as a spreadsheet, and in the field of measurement of thickness and topography of layers of materials on carriers; measuring instruments including manual instruments for testing using eddy currents and ultrasounds to detect and characterize surface and sub-surface flaws in conductive materials; instruments for measurement of thickness and topography of layers of materials on carriers; instruments for measurement of geometric, electromagnetic and ultrasonic properties of layers of materials on carriers; component parts of all of the above

Scientific and technological services, reasearch and designer services relating to measuring and testing of thickness to detect and characterize surface and sub-surface flaws in metal and not of metal in conductive materials including the testing of thickness of uncured coatings in the form of powder, laquer or adhesive layers of materials on carriers, on surfaces and on reference surfaces of metal and not of metal