Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunneling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunneling microscopy, and near-field optical microscopy; scanning electron microscopes and probes therefore; scanning near field optical microscope and accessories therefore, namely probes and lenses; confocal microscopes and accessories therefore, namely electronic imaging scanners; digital holographic microscopes and accessories therefor, namely objective lenses; scanning tunneling microscopes and tips therefore; interferometers; white light interferometric profilers made of metal, plastic and glass fibers and used to analyze surface topography at the nano scale; electronic mechanical vibration isolation equipment, namely a platform with instruments designed to protect against vibration and measurement distortion caused by noise, air flow, near by streets and movement of people; computer software designed to analyze images in the field of scanning probe microscopy, atomic force microscopy, near-field scanning optical microscopy and scanning tunneling microscopy; image database management software; electrical sound protection systems, namely, acoustic vibration isolation chambers; electrical power supplies; voltage surge suppressors; low pass inductor filters used in high power electrical applications

Retail store services in the field of Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunnelling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunnelling microscopy, and near-field optical microscopy; scanning electron microscopes and probes therefore; scanning near field optical microscope and accessories therefore, namely probes and lenses; confocal microscopes and accessories therefore, namely electronic imaging scanners; digital holographic microscopes and accessories therefor, namely objective lenses; scanning tunnelling microscopes and tips therefore; interferometers; white light interferometric profilers; mechanical vibration isolation equipment, namely instruments designed to protect against vibration and measurement distortion caused by noise, air flow, nearby streets, movement of people; computer software designed to analyse images in the field of scanning probe microscopy, atomic force microscopy, near-field scanning optical microscopy and scanning tunnelling microscopy; image database management software; acoustic vibration isolation chambers; electrical power supplies; voltage surge suppressors; low pass inductor filters used in high power electrical applications