Scientific apparatus and instruments, namely scanning probes for use in scanning probe microscopes for detecting structures on the submicron scale by mechanically contacting said structures

[ Material processing, namely, using semiconductor processing methods for the coating of carrier materials, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide in the preparation of probes for scanning microscopes; custom production of prods for probe devices for microscopes that use additive and/or subtractive, chemical and/or mechanical and/or electronic methods; materials processing of probe devices, namely, scanning probes for microscopes by coating, using mechanical or electronic or chemical methods; treatment of materials, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide, by coating, etching, metallizing, annealing, oxidizing or laser treatment; coating silicon, carbon, silicon oxide, silicon nitride, or silicon carbide with metals, insulators, semiconductors or organic chemicals for the purpose of producing conductive probes, insulating probes or semi-conducting probes for scanning microscopes ; etching of surfaces, namely, silicon, carbon, silicon oxide, silicon nitride, or silicon carbide by using wet chemical, dry chemical or mechanical or electronic methods. ]

[ Scientific and industrial research, namely, in the area of mesoscopic technology; development of calibrations standards; using scanning electron microscopes and atomic force microscopes to analyze surfaces and present visual representations of the surfaces so analyzed; scientific investigations, scientific analyses, scientific recordings, and scientific evaluations, namely, using scanning electron microscopes and atomic force microscopes, in the field of microtechnology or nanotechnology. ]