digital, charge-coupled device cameras [ and television cameras ] for use in electron microscopy; digital camera controllers for use with transmission electron microscope cameras; imaging filters for use with transmission electron microscopes; detectors for use in detecting variations in the deflection of an electron beam off a sample surface, for use in scanning transmission electron microscopy; specimen holders for use with electron microscopes, not for medical use; specimen clamping units sold as integral components of specimen holders for use with electron microscopes, not for medical use; cooled specimen holders, not for medical use, and storage containers for transfer and examination of cryogenically cooled specimens, and digital temperature controllers therefor; cryofixation chambers for use in cryogenically freezing specimens, and tools and transfer containers for use therewith; work stations for use in the transfer and preparation of cryogenically cooled specimens; pump out tools for the transfer of cryogenically cooled specimens; diaphragm and molecular drag pumps for evacuating liquids and gases from specimen holders, creating a vacuum for storage of specimens and testing specimen holders; work stations for use of vacuum pumps; specimen heating holders; specimen cooling holders and stages, anti-contaminator and airlock chambers; low temperature chambers for preparation of specimens and transfer of specimens to a scanning electron microscope; cathodoluminescence imaging systems for the detection and collection of photons emitted from a specimen interacting with an electron beam, consisting of a charge-coupled device camera, collection optics, optical filters, a photomultiplier tube and photodiode, and computer programs for use in collecting, analyzing, archiving and presenting images; digital spectrometers; parallel-detection electron energy-loss spectrometers; energy-filtering electron energy-loss spectrometers optimized for biological electron microscope applications; apparatus for rotating and exchanging laboratory specimens sold as an integral component of an ion milling machine; ion beam coating chambers, for use in preparing specimens for scanning and transmission electron microscopy; ion beam etching and sputter coating chambers for use in preparing specimens for scanning, electron and light microscopy; ion polishers for use in preparation of specimens for transmission electron microscopy; ultrasonic disc cutters for use in cutting wafers from brittle specimens for examination via transmission electron microscopy; apparatus, namely, ion milling machines, for preparing cross sections of specimens for transmission electron microscopy; disc grinders and dimple grinders used to thin and polish brittle specimens, in preparation for examination via microscopy; disc punches used to cut ductile and soft specimens into discs, in preparation for examination via microscopy; electronic apparatus for reducing ambient magnetic fields in environments where scanning electron microscopes and scanning transmission electron microscopes are used; computer software for use in the field of microscopy, namely, computer software for use in the preparation and manipulation of microscopic specimens; computer software for use in microscopic imaging and analysis; computer software for use in the acquisition, processing, analysis and presentation of microscopic image data; computer software for use in tuning transmission electron microscopes; computer software for use in the production of composite images from adjacent images acquired with a charge-coupled device camera; computer software for use in the automatic adjustment of imaging parameters of a transmission electron microscope's focus, stigmation and beam tilt, for high resolution electron microscopy; computer software used to automate analysis of selected area electron diffraction patterns and high-resolution lattice images of crystalline samples; computer software for use in off-axis electron holography; computer software for use in automating graphic interchange format alignment; computer software for controlling and automating the operation of an energy filter and transmission electron microscope combination, and for automating data analysis relating thereto; computer software for use in studying the electrical properties of semiconductor materials and devices via scanning electron microscopy and scanning transmission electron microscopy; equipment for use in conjunction with scanning electron microscopes for studying the electrical properties of semiconductor materials and devices through the application of electron beam induced current, namely, charge-coupled device cameras, current amplifiers, computers and monitors, sample holders, specimen holder exchange tools, stage adaptors to take sample holders, electron beam induced current and beam current signal cables, and test boxes incorporating a low noise current source and photodiode; computer software for use in conjunction with scanning electron microscopes for studying the electrical properties of semiconductor materials and devices through the application of electron beam induced current, namely, computer software for use in signal sampling and controlling the amplifier and electron beam; specimen tensile and heating stages, namely, specimen stages equipped with grips for use in heating and deforming specimens; all of which are used in scientific and medical research