Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely integrated circuit verification, debug, and failure analysis systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; automated test equipment comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; backside device imaging units; photon timing systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; temperature mapping systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; and emission detection systems comprised of microscopes, test signal generators, detectors, chip and/or wafer adapters, and computing hardware and operating and analysis software; all of the forgoing for measuring the performance characteristics of semiconductors