ACCRETECH - Trademark Details
Status: 606 - Abandoned - No Statement Of Use Filed
Image for trademark with serial number 76182002
Serial Number
76182002
Word Mark
ACCRETECH
Status
606 - Abandoned - No Statement Of Use Filed
Status Date
2006-04-23
Filing Date
2000-12-15
Mark Drawing
1000 - Typeset: Word(s)/letter(s)/number(s) Typeset
Published for Opposition Date
2003-01-28
Attorney Name
Law Office Assigned Location Code
M40
Employee Name
AMOS, TANYA L
Statements
Goods and Services
Brokerage of manufacturing and measuring apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines
Goods and Services
Repair and maintenance service for manufacturing and measuring apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines
Goods and Services
Rental of manufacturing apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Rental of measuring apparatus, namely-- Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines
Classification Information
International Class
36 - Insurance; financial affairs; monetary affairs; real estate affairs. - Insurance; financial affairs; monetary affairs; real estate affairs.
US Class Codes
100, 101, 102
Class Status Code
6 - Active
Class Status Date
2001-01-02
Primary Code
036
International Class
37 - Building construction; repair; installation services. - Building construction; repair; installation services.
US Class Codes
100, 103, 106
Class Status Code
6 - Active
Class Status Date
2001-01-02
Primary Code
037
International Class
40 - Treatment of materials. - Treatment of materials.
US Class Codes
100, 103, 106
Class Status Code
6 - Active
Class Status Date
2001-01-02
Primary Code
040
Correspondences
Name
CURTIS B HAMRE
Address
Please log in with your Justia account to see this address.
Prior Registrations
Relationship TypeReel Number
Continuity Child76976714
Trademark Events
Event DateEvent Description
2001-03-29ASSIGNED TO EXAMINER
2001-04-11NON-FINAL ACTION MAILED
2001-10-11CORRESPONDENCE RECEIVED IN LAW OFFICE
2002-02-05FINAL REFUSAL MAILED
2002-07-15PAPER RECEIVED
2002-07-15CORRESPONDENCE RECEIVED IN LAW OFFICE
2002-11-25APPROVED FOR PUB - PRINCIPAL REGISTER
2003-01-08NOTICE OF PUBLICATION
2003-01-28PUBLISHED FOR OPPOSITION
2003-04-22NOA MAILED - SOU REQUIRED FROM APPLICANT
2003-10-14PAPER RECEIVED
2003-10-14EXTENSION 1 FILED
2003-11-10EXTENSION 1 GRANTED
2004-04-23PAPER RECEIVED
2004-04-26ASSIGNED TO EXAMINER
2004-04-23DIVISIONAL REQUEST RECEIVED
2004-05-04DIVISIONAL PROCESSING COMPLETE
2004-04-20EXTENSION 2 FILED
2004-05-04EXTENSION 2 GRANTED
2004-08-11CASE FILE IN TICRS
2004-10-20TEAS EXTENSION RECEIVED
2004-10-20EXTENSION 3 FILED
2004-10-29EXTENSION 3 GRANTED
2005-02-28TEAS EXTENSION RECEIVED
2005-02-28EXTENSION 4 FILED
2005-03-18EXTENSION 4 GRANTED
2005-09-08TEAS EXTENSION RECEIVED
2005-09-08EXTENSION 5 FILED
2005-09-08EXTENSION 5 GRANTED
2006-06-27ABANDONMENT - NO USE STATEMENT FILED
2006-06-27ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED